From ferguson@cmuhep2.phys.cmu.edu Mon Apr 20 10:12:40 1998
Date: Thu, 16 Apr 1998 11:33:50 -0400 (EDT)
From: Thomas Ferguson <ferguson@cmuhep2.phys.cmu.edu>
To: Yuri Bonushkin <bonushki@physics.ucla.edu>
Subject: Re: Anode electronics

 Here is our test beam wish-list for the anodes:

      List of Measurements to be Made on the Anode Electronics
               During the Summer 1998 Beam Test at CERN

1) Measure the single-plane anode efficiencies and the total number of anode
hits on a track as a function of chamber high voltage, position of the track
along the wire, preamp threshold and track inclination angle (theta).

2) Measure the single-plane and multi-plane anode timing resolution as a
function of all the variables mentioned in 1).

3) Measure the random anode wire hit rate as a function of chamber high
voltage and preamp threshold.

4) Measure the efficiencies and timing resolution as a function of the
background rate in the chamber using the GIF.

5) Measure the recovery time of the anode electronics by using the high
background rate of the GIF.  We can do this by looking at situations where
there was a background hit in a set of wires at a certain time before the
arrival of a real muon through the same set of wires, by using the multi-hit
capability of the TDC's.  Then we can measure how close in time the muon can
come to the background time and still get a new output from the electronics.

6) Measure the threshold, gain and time-offset stability of the electronics
as a function of time.

7) Measure the cross-talk probability as a function of the variables mentioned
in 1).

Regards,
Tom