Anode electronics status
(presented by N.Bondar, PNPI)
EMU meeting at CERN, Sep 11-12, 1999
Anode Front-end Electronics current status.
1. Our goal was:
-Improve anode chip performance
-Prepare 96 channels combined board for the test in CERN
-Our ambitious plan was to prepare a prototype of 16 channels board
for test in CERN.
2. What done:
-Reason for oscillation was understood and fixed and two submissions
of 16 channels chips (CMP16B and CMP16CC) was submitted and
received. (Chip CMP16B Layout) (Chip CMP16C Layout-not available)
-96 channels "combined" board AD96D was designed in cooperation with
UCLA group. (AD96D board view)
-Special Test stand for testing our chips was designed and assembled. (Stand)
-All chips were tested on the Stand (more than 1000 channels was
measued). We received understanding of the chip performance and
technological process stability (gain variation, threshold
distribution, propagation time distribution and so on).
See chip performance in (CMP16B) and (CMP16C)
The best chips were installed on the AD96D boards.
-These boards were tested on bench (see in the page CMP16C)
and first results were received on the cosmic ray stand in Fermilab,
(see N.Terentiev's talk on EMU meeting at UCLA, Apr 29-30, 1999, Talk)
-Few chips were irradiated in OSU with 5 sec radiation time step.
Each 5 sec is about 15-20 CMS years.
Chip with 5 sec radiation dose was alive (measurement was performed
after two weeks - time for delivery).
Chips with 10 sec and 15 sec radiation dose became to work two more
weeks later. Chips with 20, 25 sec and more still dead.
-Also a prototype of chip without delay - 8 channel amplifier-discriminator (CMP8)
chip was submitted and received (picture of this chip - not available yet)
-Two types of 16 channel boards were designed:
for 16 channel chip (16 ch board) and for 2 x 8 channel chips (8+8 ch board)
Unfortunately these boards were made in the very end of July and
tested very briefly on the bench. The results of these measurements
were very optimistic - on bench this chip can work without
oscillation up to the noise level.
3. On GIF:
-Four AD96 channel "combined" boards were installed and tested. After
fixing most of "grounding and shielding" problems the noise level
became about 2fC (It is pretty close to that we have in Fermilab).
These board can work at the threshold as low as 20fC (view AD96D
and AD16 on the P2" chamber at GIF, CERN)
-Then the 16 channel boards were installed on the chamber and tested.
Result of this test is the next - the 16 channels board with CMP8
chips (without "digital" part inside the chip) looks very stable.
It works without problems with threshold 20fC and it is possible to
set threshold even lower (we have to try it).
Other problem - the chamber becomes nosier with higher voltage and it
seems that we need to increase the threshold with increasing the
high voltage.
First results of the measurement were presented by N. Terentiev (talk).
4. September submission :
-Submitted new 16 channels chip with improvement we discussed in summer
(test feature, reliability, power consumption).
-Submitted new 16 channels chip - the same but without delay inside
the chip. We would like to compare these two options in the same
conditions to make the final conclusion. (picture not available yet)
-Submitted a prototype of one more chip - LVDS receiver and converter
to TTL with a controlled delay.(Picture not available yet)
Reasons for this chip:
* The cost for LVDS receiver plus extra cable is about the same
like for this chip.
* It allows us to improve the anode frond-end performance:
-remove noisiest "digital" parts from the analog part and
make the chip more stable;
-decrease power consumption of the anode front-end up to
30mW/channel (just now 40mW/channel).
* As far as this new chip already is a digital chip it is
possible to implement more digital features in it:
-increase number of bits to control delay and decrease one
step value (4 bits delay control word was implemented, it
means 16 divisions per 2ns - common delay 32ns);
-organize serial line to download delay data into the chip
to simplify slow control network;
-control even each channel individually.
5. Before mass production we need to do:
-Measure new chips and make final conclusion what chip is ready for production.
-Modify 16 channels board according the latest agreements.
-Finalize "Integration" technical problems
-Perform more detailed radiation test
-Perform measurements to estimate the chip reliability, production
efficiency, parameters consistency
-Design mass production measurement procedure (what measurements will
be performed directly in wafer during production and what we need to do after).
bondar@fnal.gov (HTML version - teren@fnal.gov)
Last modified: Oct 22 11:00:00 CST 1999