Reviews.

The CMS Endcap Muon CSC Anode Front-End Electronics Documentation.

Data sheets.

CMP16G Amplifier-Discriminator ASIC (CMP16G).

AD16 Anode Front End Board (manual).

Protection Board (PB-10 and PB-20).

D16G Delay ASIC (D16G).

Notes.

1.Anode electronics crosstalk on the ME234/2 chamber. Aug. 2002. (in progress...).

2.Anode electronics crosstalk on stand. Nov. 2002. (Qmax=18750 fC) and (Qmax=112500 fC).

3.Comparison of the AFEB parameters in the all channels vs single channel test. Nov. 2002. (Thresholds), (Time).

4.ALCT/AFEB calibration at UF, Dec. 2002 (preliminary):

- ADC calibration ( ALCT288, ALCT384, ALCT672).

- DAC calibration ( ALCT288, ALCT384, ALCT672).

- AFEB test pulse calibration, ALCT288 ( pulse shape at DAC=25, max. ampl. vs DAC offset and slope).

- AFEB test pulse calibration, ALCT384 ( pulse shape at DAC=25, max. ampl. vs DAC offset and slope).

- AFEB test pulse calibration, ALCT672 ( pulse shape at DAC=25, max. ampl. vs DAC offset and slope).

- Test cathode strip pulse calibration, ALCT288 ( pulse shape at DAC=25, max. ampl. vs DAC offset and slope).

- Test cathode strip pulse calibration, ALCT384 ( pulse shape at DAC=25, max. ampl. vs DAC offset and slope).

- Test cathode strip pulse calibration, ALCT672 ( pulse shape at DAC=25, max. ampl. vs DAC offset and slope).

- AFEB's "20 fC" nominal thresholds (FAST site test #13 vs Fermilab stand) ( ALCT384 on ME234/2, ALCT672 on ME2/1).

5. AFEB's "20 fC" nominal thresholds at ISR, CERN (FAST site test #13a) vs Fermilab stand:

- ALCT384 on ME234/2 N 48,

- ALCT384 on ME234/2 N 53.

6. Effective AFEB's threshold vs test pulse rise time (Fermilab stand):

- two board adapter, preliminary.

- two board adapter, U20 deficit.

7.Pictures of individual board test results (example for AFEB N=35):

- Thresholds, Resolution time, Propagation and slewing time.

Last modified: Fri March 21 12:30:00 CST 2003 teren@fnal.gov