ASIC Chip Test Stand at Fermilab



  • Introduction.

  • The CMP16 ASIC chip test stand has been in operation at Fermilab since the end of Jan 99 (Picture) , (see also A.Golyash's talk at EMU meeting at Fermilab on Feb. 19-20, 1999, talk ). The prototype was designed and built at PNPI (Prototype) by N.Bondar and A.Golyash. The stand allows to measure the threshold of the chip, preamplifier gain and noise, slewing time, time resolution, crosstalks. Here we present the results of the measurements done in Feb. - Apr. 99 for two CMP16A chips (data taking - A.Golyash, analysis - N.Terentyev, helpful comments - T.Ferguson). The chips CMP16A were also tested in the test beam at CERN during 1998 summer (CERN Beam test 98) . The first results for the new chip CMP16B (Nov. 1998 submission) recently obtained on the stand are also presented.
    The chips are denoted here as the following:
     - CMP16A	Jan. 14, 1998 submission	Used in summer 1998 test beam
    
     - CMP16B	Nov. 18, 1998 submission	Starting to test in Apr. 99
    
     - CMP16C and	Mar. 15, 1999 submission	Should get back end of May, 99
       CMP8C					First 8-channel chip
    

  • Preamplifier thresholds, noise and gain (two CMP16A chips) at Cin=0,50,100,150 and 220 pF .

  • - Minimum (oscillations free) thresholds and noise (Fig.1) , where:
    	Page 1   - thresholds (fC) vs channel # at different Cin
    	Page 2   - noise (fC)  vs channel # at different Cin
    	Page 3,4 - threshold vs Cin for each channel
    	Page 5,6 - noise  vs Cin for each channel     
    On the pages 1-2 of (Fig.1) the channels 65-80 are for the first chip and 81-96 - for the second one. Also though the plot titles say chip 5, chip 6 or chip 3, chip4 (in time resolution results below), the data were taken for one and the same two chips (3,5 stand for the first chip and 4,6 - for the second). We are sorry about inconvinience this can cause, it will be corrected later.

    - Thresholds vs JTAG (Fig.2) , where:
    	Page 1-10 - thresholds channel by channel
    	Page 11   - thresholds vs channel # at fixed JTAG=180
    
    - Noise vs JTAG (Fig.3) , where:
    	Page 1-10 - noise channel by channel
    	Page 11   - noise vs channel # at fixed JTAG. The line 1.0+0.011*Cin
                        is from the chip specification  (Spec.) . Data for chip 6 
    		    are presented at JTAG=210 because they are not available at JTAG=180.
    
    - Amplifier gain and discriminator level (Fig.4) , where:
    	Page 1-10 show calculation of the gain and discriminator level for each
                      channel. The Ud means the discriminator offset (in mV) 
    		  relatively to the discriminator level. The Ud is controlled 
    		  by JTAG. The Thr.(fC) is the threshold at given JTAG. The fit
    		  of the first 3 points by the straight line  gives the 
    		  gain (in mv/fC) and discriminator level as Ud at which the 
    		  line crosses the Ud axis.
    	Page 11 - gain (mv/fC) vs ch # at different Cin
    	Page 12 - discr. level (mv) vs ch #  at different Cin
    

  • Slewing time and time resolution ( two CMP16A chips).

  • - Mean time vs Cin, channel by channel for Qin=200 fC (Fig.5)
    - Mean time vs input charge for chip 1, Cin = ( 0, 50, 100, 150, 220 ) pF and chip 2, Cin = ( 0, 50, 100, 150, 220 ) pF
    - Time resolution vs input charge for chip 1, Cin = ( 0, 50, 100, 150, 220 ) pF and chip 2, Cin = ( 0, 50, 100, 150, 220 ) pF
    - Slewing time as Max(Mean Time) - Min(Mean Time) in the region of Qin=100-900 fC at Cin=150 pF (will follow).

  • Preliminary results from the first new chip CMP16B (Nov. 98 submission) at Cin=220 pF.

  • - Thresholds and noise ( JTAG=125 , JTAG=130 , JTAG=135 ).
    - Gain and discriminator level ( Gain ).
    - Slewing time (mean time vs Qin) ( JTAG=135 ).
    - Time resolution (RMS vs Qin) ( JTAG=135 )

    teren@fnal.gov
    Last modified: Sat Apr 24 20:35:00 CST 1999